Cold and Hot Dwells - Scenario 2

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Testing For: 
  • Assemblies (SRU) Equipment or Unit (LRU/LRM)
  • The tailoring process described in this standard (i.e., systematically considering detrimental effects that various environmental factors may have on a specific materiel system throughout its service life) applies throughout the materiel acquisition cycle to all materiel developed for military or commercial applications, including foreign and non-development item (NDI) procurements, procurements, or modifications of Allied systems or materiel, and cooperative development opportunities with one or more Allied nations to meet user and interoperability needs (DoDD 5000.1). *Note that this spec. is being revised specifically for HALT and HASS
  • For the purpose of this standard, the term "devices" includes such items as monolithic, multichip, film and hybrid microcircuits, microcircuit arrays, and the elements from which the circuits and arrays are formed.
Standard: 
  • Guide for Defining and Performing Highly Accelerated Tests
  • SAE/USCAR-2 Revision 5 Revised 2007-11 PERFORMANCE SPECIFICATION FOR AUTOMOTIVE ELECTRICAL CONNECTOR SYSTEMS
  • J2464
  • UL 2054
  • UL 1642
Failure Type : 
F(d) = Failures accelerated by hot and cold dwells (particularly solder creep)
Stressor: 
Cold and Hot Dwells
Qualmark Accelerated Reliability System: 
+200°C, -100°C at >70°C/min
Testing Scenario Type: 
Cold and Hot Dwells

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